NANOFABRICATION AND CHARACTERISATION - 2019/0
Module code: EEEM050
Module Overview
Expected prior learning: None specifically advised.
Module purpose: Introduction to experimental techniques and practical skills in nanotechnology, nanoelectronics and nanoscale device fabrication
Module provider
Electrical and Electronic Engineering
Module Leader
STOLOJAN Vlad (Elec Elec En)
Number of Credits: 15
ECTS Credits: 7.5
Framework: FHEQ Level 7
Module cap (Maximum number of students): N/A
Overall student workload
Independent Learning Hours: 120
Lecture Hours: 19
Tutorial Hours: 11
Module Availability
Semester 1
Prerequisites / Co-requisites
None.
Module content
Indicative content includes the following.
1. Data and image processing and analysis [4 hours teaching + 2 hours tutorial]
a.Experimental and statistical errors.
b.Fourier Transforms for image and data processing.
c.Introduction to image processing and particle analysis.
d.Introduction to data processing and analysis.
e.Introduction to Origin Lab Data Analysis and Displaying software.
2. Optical Microscopy and Spectroscopy [3 hours teaching +2 hours tutorial]
a.Optical and 3D optical microscopies.
b.UV-Vis-NIR, FTIR and luminescence spectroscopies.
c.Raman spectroscopy.
3. Nanostructure growth and deposition [2 hours teaching + 1 hour tutorial]
a.Chemical Vapour Deposition growth of nanostructures.
b.Solution processing of nanostructures
c.Laser deposition and formation of nanostructures.
4. Surface characterisation and electrical properties [2 hours teaching + 2 hour tutorial]
a.Electron and ion-beam microscopies.
b.STM/AFM techniques.
c.Electrical measurements at the nanoscale.
d.Solar simulators for solar cells.
5. Micro and Nano -Electromechanical Systems: Principles and Fabrication [4 hours teaching+ 2 hours tutorial]
a.Fundamentals of MEMS and NEMS design and processing, use in sensors, microsystems technology and applications.
b.Mechanics on the nanoscale.
c.Key drivers associated with developing new technologies and the development of next generation nano-bio devices with illustrative examples will be discussed
6. Ion Beam Analysis [4 hours teaching + 2 hour tutorial]
a.Introduction to ion implantation in electronics.
b.Rutherford backscattering spectroscopy
c.Thin film characterisation
Assessment pattern
Assessment type | Unit of assessment | Weighting |
---|---|---|
Coursework | COURSEWORK | 40 |
Examination | 2 HOUR CLOSED BOOK EXAMINATION | 60 |
Alternative Assessment
Not applicable: students failing a unit of assessment resit the assessment in its original format.
Assessment Strategy
The assessment strategy for this module is designed to provide students with the opportunity to demonstrate the following:
· The practical analysis of data, including specifically error estimation and derivation.
· The design of a scientific presentation.
· The understanding of the wider scope of a specific piece of research, through literature review
· The graphical representation of results and analysis, including the understanding the role of figure captions.
· The ability to understand the fundamental theory behind major experimental techniques used in nanotechnology and fabrication and apply it to case studies and examples.
· A general understanding of the achievements and challenges facing the next generation of nanoscale devices.
Thus, the summative assessment for this module consists of the following:
A.EXAM: 2-hour, closed-book written examination
B.COURSEWORK: There are 3 elements to the assignment:1.a 1000-word literature review on a chosen subject agreed with the module organiser (2 week-long 'Literature Review' assignment),
2.generating figures and some basic analysis of a data set from a spectroscopic technique in publication-quality figures (1 week-long 'Figures and Images' assignment)
3.preparing and delivering a presentation on the spectroscopic data in the 'Figure' assignment (1 week-long 'Presentation' assignment.
Any deadline given here is indicative. For confirmation of exact dates and times, please check the Departmental assessment calendar issued to you.
Formative assessment and feedback
For the module, students will receive formative assessment/feedback in the following ways.
· During lectures, by question and answer sessions
· During tutorials/tutorial classes
· By means of unassessed tutorial problem sheets (with answers/model solutions)
· During supervised computer laboratory sessions
· Via assessed coursework
Module aims
- Introduce students to common analytical experimental techniques used in nanoelectronics and nanotechnology, such as: 1) optical microscopy (eg. confocal) and spectroscopies (eg. Raman); 2) scanning probe microscopy (eg. Atomic Force Microscopy and its variants); 3) ion, X-ray and electron beam spectroscopies (eg. Rutherford Backscattering, Energy-dispersive X-ray); 4) electrical measurements and 5) solar power simulators.
- Provide practical experience in analysing data and measurement errors
- Provide some of the soft skills used in communicating research results, such as literature searching, use of referencing database, producing journal-quality figures and presenting results.
- Introduction to electronics and electro-mechanical fabrication techniques (lithography, printing).
Learning outcomes
Attributes Developed | ||
001 | To apply the fundamental theory of basic experimental characterisation to examples and case studies in nanoelectronics and nanotechnology. | KC |
002 | To critically analyse experimental data and present to an audience, in publication-quality format | KCPT |
003 | To critically analyse and interpret information gained from scientific journals. | KCT |
Attributes Developed
C - Cognitive/analytical
K - Subject knowledge
T - Transferable skills
P - Professional/Practical skills
Methods of Teaching / Learning
The learning and teaching strategy is designed to achieve the following aims.
The course covers some of the fundamentals behind nanotechnology and moves on to discuss their practical implementation in nanoscience and quantum engineering, nanomaterials and nanotechnology, before discussing future trends and applications. Coupled with this, the course teaches some of the basics of scientific communication, from literature review to the design and planning of publication-quality images and figures, to the presentation of data. It also strengthens the some of the basic mathematical skills necessary for data analysis.
Learning and teaching methods include the following.
•19 hours lectures
•11 hours tutorials
•3 hours revision
Indicated Lecture Hours (which may also include seminars, tutorials, workshops and other contact time) are approximate and may include in-class tests where one or more of these are an assessment on the module. In-class tests are scheduled/organised separately to taught content and will be published on to student personal timetables, where they apply to taken modules, as soon as they are finalised by central administration. This will usually be after the initial publication of the teaching timetable for the relevant semester.
Reading list
https://readinglists.surrey.ac.uk
Upon accessing the reading list, please search for the module using the module code: EEEM050
Programmes this module appears in
Programme | Semester | Classification | Qualifying conditions |
---|---|---|---|
Nanotechnology and Renewable Energy MSc | 1 | Compulsory | A weighted aggregate mark of 50% is required to pass the module |
Electronic Engineering with Nanotechnology MEng | 1 | Compulsory | A weighted aggregate mark of 50% is required to pass the module |
Electronic Engineering MEng | 1 | Optional | A weighted aggregate mark of 50% is required to pass the module |
Electronic Engineering MSc | 1 | Optional | A weighted aggregate mark of 50% is required to pass the module |
Electronic Engineering (EuroMasters) MSc | 1 | Optional | A weighted aggregate mark of 50% is required to pass the module |
Please note that the information detailed within this record is accurate at the time of publishing and may be subject to change. This record contains information for the most up to date version of the programme / module for the 2019/0 academic year.