CHARACTERISATION OF ADVANCED MATERIALS - 2020/1
Module code: ENGD022
In light of the Covid-19 pandemic, and in a departure from previous academic years and previously published information, the University has had to change the delivery (and in some cases the content) of its programmes, together with certain University services and facilities for the academic year 2020/21.
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This module describes popular methods for the microscopy and the bulk and surface analysis of advanced materials.
Mechanical Engineering Sciences
WATTS John (Mech Eng Sci)
Number of Credits: 0
ECTS Credits: 0
Framework: FHEQ Level 8
JACs code: J500
Module cap (Maximum number of students): N/A
Prerequisites / Co-requisites
The methods to be included are X-ray analysis in the electron microscope by energy dispersive and wavelength dispersive spectrometry (EDS and WDS); surface analysis by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES); together with the ion beam techniques of secondary ion mass spectrometry (SIMS) and Rutherford backscattering spectrometry (RBS). Structure determination by X-ray and electron diffraction (XRD and ED) will also be included.
The module is directed at scientists and engineers who require a grounding in these methods for trouble-shooting investigations or longer term research projects. The basic principles used for the physical characterisation of materials will be outlined; microscopy by light, electrons and scanned probes will be introduced and the readily available bulk characterisation methods such as diffraction, X-ray analysis and vibrational spectroscopies will be described. Surface analysis by electron and ion spectroscopies will also form and important part of the course. Particular emphasis will be paid to the use of a variety of methods in multi-technique approaches for the characterisation of advanced materials.
• Overview of Physical Property Characterisation
• Thermal Analysis
• X-Ray Diffraction – Basic Concepts
• X-Ray Diffraction – Examples
• Infra-Red Spectroscopy
• Light Microscopy
• Image Acquisition Analysis and Processing
• Electron Interactions
• Scanning Electron Microscopy I & II
• Chemical Analysis in Electron Microscopy
• Transmission Electron Microscopy
• Scanning Probe Microscopies
• Auger Electron Spectroscopy and Microscopy
• Secondary Ion Mass Spectrometry
• Particulate Systems
• Inorganic Thin Films and Coatings
• Organic Coatings
• X-Ray Photoelectron Spectroscopy
|Assessment type||Unit of assessment||Weighting|
|Coursework||Short answer questions||50|
|Coursework||Long answer question involving calculation, analysis, discussion involving core aspects of the module.||50|
The assessment strategy is designed to provide students with the opportunity to demonstrate both a knowledge across the whole breadth of the module and a deeper cognitive/analytical ability alongside deeper knowledge in specified areas.
The 5 short questions of the assessment package are able to test knowledge and understanding of a broad range of topics covered in the module. The longer question is aimed at assessing the knowledge of specific chosen topics and depth of understanding expected at this level.
Thus, the summative assessment for this unit consists of:
• Q1 (Short answer questions) 50%
• Q2 (Essay question) 50%
• Formative verbal feedback is given in lectures and tutorials.
• Written feedback is given on the submitted coursework
- provide a systematic understanding of the principles, equipment and practices of the most popular materials characterisation methods based on microscopy, chemical, physical and structural analysis and thermal techniques
- Equip students with the knowledge of a broad range of characterisation techniques, such that they clearly understand the capabilities of such methods and their role in completing the process-structure-property relationship.
|001||Have an understanding of the principles and a knowledge of the capabilities and limitations of the different types of analysis covered in the course A1||CK|
|002||Demonstrate an understanding of the underlying issues through the appropriate interpretation of assessment questions||CK|
|003||Be able to recommend appropriate methods for particular problems and have a good understanding of the data obtained adhesive||CK|
|004||Apply course subject matter for research and advanced academic enquiry||C|
C - Cognitive/analytical
K - Subject knowledge
T - Transferable skills
P - Professional/Practical skills
Overall student workload
Independent Study Hours: 30
Lecture Hours: 10
Tutorial Hours: 10
Laboratory Hours: 10
Methods of Teaching / Learning
The learning and teaching strategy is designed to:
Introduce the fundamental principles of the popular methods of microscopy and analysis. This is achieved principally though lectures and laboratory demonstrations.
The learning and teaching methods include:
• 22 hours lectures
• 8 hours tutorial classes
• 30 hours coursework.
The teaching is delivered as a one-week intensive course.
Indicated Lecture Hours (which may also include seminars, tutorials, workshops and other contact time) are approximate and may include in-class tests where one or more of these are an assessment on the module. In-class tests are scheduled/organised separately to taught content and will be published on to student personal timetables, where they apply to taken modules, as soon as they are finalised by central administration. This will usually be after the initial publication of the teaching timetable for the relevant semester.
Reading list for CHARACTERISATION OF ADVANCED MATERIALS : http://aspire.surrey.ac.uk/modules/engd022
Programmes this module appears in
|Micro- and NanoMaterials and Technologies EngD||1||Compulsory||A weighted aggregate mark of 50% is required to pass the module|
Please note that the information detailed within this record is accurate at the time of publishing and may be subject to change. This record contains information for the most up to date version of the programme / module for the 2020/1 academic year.